Title:
Applying 8D Methodology to Improve the Quality of the MEMS Probe Card

Authors:
Hsiang-Fa Lin, Hsu-Hwa Chang*, Yen-Chen Yen, Wen-Kuang Tseng, Taiwan

Abstract:

This study aims to explore the effectiveness and practical operation of applying 8D methodology to MEMS probe card quality management. Through an analysis of three quality incident cases, the research investigates methods for effectively addressing product defects resulting from human error in semiconductor manufacturing processes. The findings indicate that the 8D methodology is a valuable tool for identifying root causes and formulating long-term corrective measures, including the development of standardized operating procedures, targeted re-education training, mentorship programs, and tool improvement initiatives. These interventions have proven effective in reducing the recurrence of defects and enhancing customer satisfaction. Moreover, this study emphasizes the importance of establishing a learning organization and implementing comprehensive knowledge management systems as critical strategies for fostering an organizational culture centered on continuous quality improvement. The research further recommends integrating human factors engineering principles and digital management systems to optimize maintenance operations and improve overall production quality. Such advancements are projected to strengthen the company’s competitive position within the high-precision industry by enhancing operational accuracy and reliability.

DOI: https://doi.org/10.51505/IJEBMR.2025.91214